the tools we use...
|Analysis usually begins with a visual examination under one of our optical microscopes. We also have an atomic force microscope (AFM) for special studies.|
Chemical analysis is achieved by Scanning Auger Microprobe, magnetic sector SIMS or LIMA using the instruments described below.
Mass range: 0 to 300 amu.
Mass resolution: continuously variable from 200 to 8000 .
Ion Sources : Duoplasmatron and caesium thermal ionisation .
Flood gun: Normal incidence electron gun for charge compensation of insulating samples in positive and negative secondary ion mode.
Dynamic Transfer secondary ion optics: for increased analytical sensitivity .
Analysis area : continuously variable from 2.5µm to 250µm square .
Secondary electron imaging : for feature identification at low currents.
Scanning ion imaging: for selected area analysis.
Resistive anode imaging system: for selected area analysis.
Sample rotation stage: for optimisation of topography in deep profiles and depth profiling of metal layers.
Electron beam energy: variable from 2.0 to 25.0keV
Spot size : variable from 100nm to 100µm.
N(E) or dN(E) spectra: for compatibility.
Auger electron imaging: for feature identification.
Backscattered electron imaging: for compositional or topographical imaging .
Argon ion gun: for composition depth profiling.
Ionisation: Laser ablation
Analyser: reflectron time of flight (ToF) mass spectrometer.
Analysis volume: less than a cubic micron.
Analysis capability: qualitative elemental and chemical (molecular fragment) information from small features.
Specially suitable for: analysis of particulates and finely divided materials.